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X-Ray fluorescence
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TX 2000  
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X – Ray fluorescence Spectrometer.

The radition provided by a source of X – ray is allowed to fall on the sample to analysed. The enargy of the radiation must be sufficient to displace elctrons in the K, L or M shells of the atoms present in the sample.
When an electrons from the K – shell is displaced it leaves a vacancy which destabilises the enargy structures of the atom.
An electron from a higher – enargy level will fall into vacancy . such an electron can be provided by the L – shell , the enargy associated with this transfer correspondins to that of the emission of a photon of Ka with energy equal to the difference in energy possessed by electrons of the K and L shells. Such a transfer results also in a vacancy being created in the L – orbital which in turn is filled by transfer of an electron from the M – orbital with emission of a photon L. This allows the atom to return to a more stable energy state. The Spectrum of wavelengths resulting from the energy – level – jumps of the electrons into the K – orbital is called th “ K– Series”.
Those originating in the L and M– orbitals are similarly called “L and M Series.

Related Product

TX 2000.
The TX2000 is the unique spectrometer that allows to perform Energy Dispersive X – Ray Fluorescence analysis in both Total Reflection and Traditional (45 degrees) Geometry. TXRF is founded on the same principles of the EDXRF with, however, one significant difference. In Contrast to EDXRF, where the primary beam strikes the sample at an angle of 450 …

Description:
 TXRF is founded on the same principle of the EDXRF with, however, one significant difference. In contrast to EDXRF , where the primary beam strikes the sample at an angle of 450 TXRF used a glancing angle of a few milliradians.
Owing to this grazing incidence, the primary beam is totally reflected.Byilluminatting the sample with a beam that is being totally reflected, absorption of the beam in the supporting substrate is largely avoided and the associated scattering is greatly reduced. This also reduced the background noise substantially.
A further contribution to the reduction of the bacground noise is obtained by minimising the thickness of the sample. A small drop of the sample ( 5 – 100 microliters of the substance dissolved in an approprite solvent) is placed on a silica carrier.
On evaporation of the solvent a thin film , a few nanometers thick , remains . In practice the greater part of the scattering normally arising from the sample and its matrix is eliminated .this is becouse matrix effect cannot build up within minute residues or thin layers of sample. Besides its high detetion power, simplified quantitative analysis in made possible by internal standard.


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